Characterization Methods for Silicon Photodiode and Silicon Sub-Surface Properties
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OF DOCTORAL DISSERTATION Author Name of the dissertation Date of manuscript Date of the dissertation Monograph Article dissertation (summary + original articles)
منابع مشابه
Change of diffused and scattered light with surface roughness of p-type porous Silicon
Porous silicon samples were prepared by electrochemical etching method for different etching times. The structural properties of porous silicon (PS) samples were determined from the Atomic Force Microscopy (AFM) measurements. The surface mean root square roughness (σ rms) changes as function of porosity were studied, and the influence of etching time on porosity and roughness was studied too. U...
متن کاملChange of diffused and scattered light with surface roughness of p-type porous Silicon
Porous silicon samples were prepared by electrochemical etching method for different etching times. The structural properties of porous silicon (PS) samples were determined from the Atomic Force Microscopy (AFM) measurements. The surface mean root square roughness (σ rms) changes as function of porosity were studied, and the influence of etching time on porosity and roughness was studied too. U...
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تاریخ انتشار 2004